首页> 外国专利> METHOD OF MEASURING CHRACTERISTIC DATA FOR MULTILEVEL OPTICAL RECORDING MEDIUM, AND EVALUATION METHOD FOR MULTILEVEL OPTICAL RECORDING MEDIUM

METHOD OF MEASURING CHRACTERISTIC DATA FOR MULTILEVEL OPTICAL RECORDING MEDIUM, AND EVALUATION METHOD FOR MULTILEVEL OPTICAL RECORDING MEDIUM

机译:多级光学记录介质的特征数据测量方法及多级光学记录介质的评价方法

摘要

A method of measuring characteristic data for a multilevel optical recording medium, comprising measuring (steps 31-33) characteristic data for a multilevel optical recording medium (1) by using a two-value recording/reproducing evaluation device. This multilevel optical recording medium (1) is so produced as to be capable of multilevel recording with light reflectance with respect to a reproducing laser beam controlled in multiple stages by switching at least one of a recording laser beam irradiation time and an irradiation power and by changing the transmittance of a recording layer (12) by a recording laser beam. Accordingly, since characteristic data for a multilevel optical recording medium (1) can be measured without newly purchasing or producing a dedicated multilevel recording/reproducing evaluation device, the measuring costs can be reduced.
机译:一种用于测量多层光学记录介质的特征数据的方法,包括通过使用二值记录/再现评估装置来测量(步骤31-33)用于多层光学记录介质(1)的特征数据。通过切换记录激光束照射时间和照射功率中的至少一个,并通过改变记录激光束照射时间和照射功率中的至少一个,来制造这种多层光学记录介质(1),从而能够对多级控制的再现激光以光反射率进行多层记录。通过记录激光束改变记录层(12)的透射率。因此,由于可以在不新购买或生产专用的多级记录/再现评估装置的情况下测量用于多级光学记录介质(1)的特征数据,因此可以降低测量成本。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号