首页> 外国专利> MEASURING METHOD OF CHARACTERISTICS DATA TO MULTILEVEL OPTICAL STORAGE-MEDIUM AND MULTILEVEL OPTICAL STORAGE- MEDIUM TO WHICH PATTERN FOR MEASURING THE CHARACTERISTICS DATA IS RECORDED

MEASURING METHOD OF CHARACTERISTICS DATA TO MULTILEVEL OPTICAL STORAGE-MEDIUM AND MULTILEVEL OPTICAL STORAGE- MEDIUM TO WHICH PATTERN FOR MEASURING THE CHARACTERISTICS DATA IS RECORDED

机译:记录了多级光学存储介质的特征数据的测量方法和记录了用于测量其特征数据的图形的多级光学存储介质的特征数据的测量方法

摘要

PROBLEM TO BE SOLVED: To provide a method for simply and accurately measuring the asymmetry of a multilevel optical storage medium.;SOLUTION: A step which measures a light reflectivity to a first virtual record cell row S00 in which more than one virtual record cell S0 is consecutively formed, a step which measures the light reflectivity to a second virtual record cell row S77 in which more than one virtual record cell S7 is consecutively formed and a step which measures the light reflectivity to a third virtual record cell row S07 in which the virtual record cell S0 and the virtual record cell S7 are alternately arranged are provided. The values of the light reflectivity obtained from the first and second virtual record cell rows S00 and S77 are values under the condition that the accordance of an adjacent virtual record cell with the contents of the virtual record cell concerned is guaranteed, and the value of the light reflectivity obtained from the third virtual record cell row is a value under the condition that the difference of the adjacent virtual record cell from the contents of the virtual record cell concerned is guaranteed.;COPYRIGHT: (C)2003,JPO
机译:解决的问题:提供一种用于简单且准确地测量多层光学存储介质的不对称性的方法。解决方案:测量对第一虚拟记录单元行S00的光反射率的步骤,其中第一虚拟记录单元行S00中有多个虚拟记录单元S0依次形成一个步骤,该步骤测量对连续形成一个以上虚拟记录单元S7的第二虚拟记录单元行S77的光反射率,以及测量对该第三虚拟记录单元行S07的光反射率的步骤。提供了交替设置的虚拟记录单元S0和虚拟记录单元S7。从第一和第二虚拟记录单元行S00和S77获得的光反射率的值是在确保相邻虚拟记录单元与所关注的虚拟记录单元的内容一致的条件下的值,并且从第三虚拟记录单元行获得的光反射率是在确保相邻虚拟记录单元与有关虚拟记录单元的内容之间存在差异的条件下的值。COPYRIGHT:(C)2003,JPO

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