METHOD FOR TESTING INTEGRATED CIRCUIT USING INTEGRATED DEBUGGING CIRCUIT

摘要

PROBLEM TO BE SOLVED: To provide a testing method capable of integrating microprocessor test input with test hardware input. ;SOLUTION: This method simulates an integrated circuit 110 and generates an input vector to an integrated circuit 110 and expected output from the integrated circuit. This input vector and expected output are generated by entering test vectors into the circuit simulator and the integrated circuit is tested using the input vector 113 to yield a first resulting output. The test hardware vector 109 is also created to capture state information pertaining to the integrated circuit. The test hardware vector and the input vector are combined to create a joint input vector 111 and debugging is performed on the integrated circuit by modifying the joint input vector and evaluating the resulting output.;COPYRIGHT: (C)2003,JPO