首页> 外国专利> Scanning type probe microscope probe and method of producing the same, and a scanning type probe microscope having this probe and polymer processing method using the same

Scanning type probe microscope probe and method of producing the same, and a scanning type probe microscope having this probe and polymer processing method using the same

机译:扫描型探针显微镜探针及其制造方法,以及具有该探针的扫描型探针显微镜及其使用聚合物的加工方法

摘要

There is provided a probe for a scanning probe microscope, comprising: a proximal end; and a distal tip portion, wherein the distal tip portion has a tip surface which faces a fixed sample, and at least one monolayer is formed at least on the tip surface, and a molecule having a chemical sensor function or catalytic function is placed in or on an outermost monolayer above the tip surface. There is provided a probe for a scanning probe microscope, comprising: a cover layer containing an electrically conductive polymer; and a catalyst in the cover layer, the catalyst being selected from a group consisting of inorganic catalysts and organic catalysts. There are provided a scanning probe microscope equipped with the above probe, and a molecule processing method using such a scanning probe microscope.
机译:提供了一种用于扫描探针显微镜的探针,包括:近端;和末端尖端部分,其中末端尖端部分具有面向固定样品的尖端表面,并且至少一个单层至少形成在该尖端表面上,并且将具有化学传感器功能或催化功能的分子置于或在尖端表面上方的最外层单分子膜上。提供了一种用于扫描探针显微镜的探针,该探针包括:包含导电聚合物的覆盖层;以及覆盖所述覆盖层的层。覆盖层中的催化剂,该催化剂选自无机催化剂和有机催化剂。提供了一种配备有上述探针的扫描探针显微镜,以及使用这种扫描探针显微镜的分子处理方法。

著录项

  • 公开/公告号US2002171038A1

    专利类型

  • 公开/公告日2002-11-21

    原文格式PDF

  • 申请/专利权人 NAKAGAWA TOHRU;YUKIMASA TETSUO;

    申请/专利号US20020130569

  • 发明设计人 TOHRU NAKAGAWA;TETSUO YUKIMASA;

    申请日2002-05-17

  • 分类号G01N23/00;

  • 国家 US

  • 入库时间 2022-08-22 00:11:03

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号