首页> 外国专利> Absolute wavelength calibration of lithography laser using multiple element or tandem see through hollow cathode lamp

Absolute wavelength calibration of lithography laser using multiple element or tandem see through hollow cathode lamp

机译:使用多元素或串联透视的空心阴极灯对光刻激光进行绝对波长校准

摘要

A tunable laser system includes a gain medium and an optical resonator for generating a laser beam, and a spectral narrowing and tuning unit within the resonator. A detection and control unit controls a relative wavelength of the laser system. A wavelength calibration module calibrates the detection and control unit. The module contains more than one species each having an optical transition line within the tuning spectrum of the laser. A beam portion of the narrowed emission from the laser is directed through the wavelength calibration module and a beam portion is directed through the detection and control unit when the laser beam is scanned through the optical transition line of each of the species within the module. The detection and control unit is monitored and calibrated during the scanning.
机译:一种可调激光器系统,包括增益介质和用于产生激光束的光学谐振器,以及谐振器内的光谱变窄和调谐单元。检测和控制单元控制激光系统的相对波长。波长校准模块校准检测和控制单元。该模块包含一个以上的物种,每个物种在激光器的调谐光谱内都有一个光学跃迁线。当激光束被扫描通过模块内每种物质的光学跃迁线时,来自激光的窄发射的光束部分被引导通过波长校准模块,并且光束部分被引导通过检测和控制单元。在扫描过程中对检测和控制单元进行监控和校准。

著录项

  • 公开/公告号US6580517B2

    专利类型

  • 公开/公告日2003-06-17

    原文格式PDF

  • 申请/专利权人 LAMBDA PHYSIK AG;

    申请/专利号US20010791431

  • 发明设计人 THOMAS SCHROEDER;PETER LOKAI;

    申请日2001-02-22

  • 分类号H01S32/20;

  • 国家 US

  • 入库时间 2022-08-22 00:07:08

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