首页> 外国专利> System for measuring response time of a circuit by determining the time difference between the earlier and the later clock pulses applied to the circuit

System for measuring response time of a circuit by determining the time difference between the earlier and the later clock pulses applied to the circuit

机译:通过确定施加到电路的较早和较晚时钟脉冲之间的时间差来测量电路响应时间的系统

摘要

A method and device for measuring the response time of a circuit are described in which clocking pulses are applied to the circuit at input pads, the input pads being connected to the circuit by circuitry having substantially the same delays. By adjusting the timing of the later clock pulse relative to the earlier clock pulse until a valid output is just achieved, the response time of the circuit can be measured using a register circuit.
机译:描述了一种用于测量电路的响应时间的方法和设备,其中将时钟脉冲在输入焊盘处施加到电路,输入焊盘通过具有基本相同的延迟的电路连接到电路。通过调整相对于较早时钟脉冲的较晚时钟脉冲的时序,直到恰好获得有效输出为止,可以使用寄存器电路来测量电路的响应时间。

著录项

  • 公开/公告号US6584577B1

    专利类型

  • 公开/公告日2003-06-24

    原文格式PDF

  • 申请/专利权人 STMICROELECTRONICS LIMITED;

    申请/专利号US20000546809

  • 发明设计人 HENRY NURSER;

    申请日2000-04-11

  • 分类号G08F11/40;G11C70/00;G11C290/00;

  • 国家 US

  • 入库时间 2022-08-22 00:06:07

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