首页>
外国专利>
System for mapping logical functional test data of logical integrated circuits to physical representation using pruned diagnostic list
System for mapping logical functional test data of logical integrated circuits to physical representation using pruned diagnostic list
展开▼
机译:使用修剪的诊断列表将逻辑集成电路的逻辑功能测试数据映射到物理表示的系统
展开▼
页面导航
摘要
著录项
相似文献
摘要
An improved method for mapping logical function test data of logical integrated circuits to physical representations uses a pruned diagnostic list. The steps include creating a final logical diagnostic list of potential bridging faults in response to testing the circuit for stuck-at faults at a plurality of nets of the circuit, receiving the physical data associated with nets of the circuit, applying adjacency criteria to the physical data, generating a pruned diagnostic list of potential bridging faults in response to applying the adjacency criteria, performing in-line inspection to obtain second localized probable defect data and correlating second localized portable defect data with the pruned diagnostic list.
展开▼