首页> 外国专利> Optical system providing concurrent detection of a calibration signal and a test signal in an optical spectrum analyzer

Optical system providing concurrent detection of a calibration signal and a test signal in an optical spectrum analyzer

机译:光学系统可同时检测光谱分析仪中的校准信号和测试信号

摘要

An optical system having a first order spectral range that is usable in an optical spectrum analyzer receives an broadband optical test signal and a optical calibration signal and couples the optical signals via two optically isolated paths to separate optical detectors. First and second pairs of optical fibers, with each pair having an input fiber and an output fiber, are positioned in a focal plane of a collimating optic that has an optical axis. The fiber pairs are symmetrically positioned on either side of the optical axis with the input fibers positioned on one side of the optical axis and the output fibers positioned on the opposite side of the optical axis. The input fibers receive the optical test signal and the optical calibration signal. The output optical fibers are coupled to first and second optical detectors. An optical calibration source generates second order or greater spectral lines that fall within the first order spectral range of the optical system. A diffraction grating receives the optical test signal and the optical calibration signal from the collimating optic and separates the first order spectral components of the broadband optical test signal and passes the second order or greater spectral lines of the optical calibration signal. The first optical detector that is responsive to the first order spectral components of the optical test signal receives the optical test signal from the collimating optic and converts the optical test signal to an electrical signal. A second optical detector that is responsive to the second order or greater spectral lines of the optical calibration signal concurrently receives the optical calibration signal from the collimating optic and converts the calibrations signal to an electrical signal.
机译:在光谱分析仪中可用的具有一阶光谱范围的光学系统接收宽带光学测试信号和光学校准信号,并且经由两条光学隔离的路径将光学信号耦合到单独的光学检测器。第一对和第二对光纤,每对具有输入光纤和输出光纤,位于具有光轴的准直光学器件的焦平面中。光纤对对称地位于光轴的两侧,输入光纤位于光轴的一侧,输出光纤位于光轴的另一侧。输入光纤接收光学测试信号和光学校准信号。输出光纤耦合到第一和第二光学检测器。光学校准源产生落在光学系统的一阶光谱范围内的二阶或更大光谱线。衍射光栅从准直光学器件接收光学测试信号和光学校准信号,并分离宽带光学测试信号的一阶光谱分量,并通过光学校准信号的二阶或更大光谱线。响应于光学测试信号的第一阶光谱分量的第一光学检测器从准直光学器件接收光学测试信号,并将光学测试信号转换为电信号。响应于光学校准信号的第二阶或更大光谱线的第二光学检测器同时从准直光学器件接收光学校准信号,并将校准信号转换为电信号。

著录项

  • 公开/公告号US6573990B1

    专利类型

  • 公开/公告日2003-06-03

    原文格式PDF

  • 申请/专利权人 TEKTRONIX INC.;

    申请/专利号US20000564298

  • 发明设计人 DUWAYNE R. ANDERSON;

    申请日2000-05-03

  • 分类号G01J32/80;

  • 国家 US

  • 入库时间 2022-08-22 00:05:18

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号