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Control of erosion profile and process characteristics in magnetron sputtering by geometrical shaping of the sputtering target

机译:通过溅射靶的几何形状控制磁控溅射中的腐蚀轮廓和工艺特性

摘要

An apparatus and method for controlling and optimizing a non-planar target shape of a sputtering magnetron system are employed to minimize the redeposition of the sputtered material and optimize target erosion. The methodology is based on the integration of sputtered material from each point of the target according to its solid angle view of the rest of the target. The prospective target's geometry is optimized by analytically comparing and evaluating the methodology's results of one target geometry against that of another geometry, or by simply altering the first geometry and recalculating and comparing the results of the first geometry against the altered geometry. The target geometries may be of many different shapes including trapezoidal, cylindrical, parabolic, and elliptical, depending upon the optimum process parameters desired. A sputtering system is developed using this methodology, having a main magnet stack, a rotating magnet, a target having selected target shapes optimized for controlling erosion, downstream magnets, a substrate, and an electric field induced plasma stream.
机译:采用一种用于控制和优化溅射磁控管系统的非平面目标形状的装置和方法,以最小化溅射材料的再沉积并优化目标腐蚀。该方法是基于从靶材每个点的溅射材料的整合,根据其对靶材其余部分的立体图进行的。通过分析比较和评估一种目标几何与另一种几何的方法学结果,或者通过简单地更改第一种几何并重新计算和比较第一种几何的结果与改变的几何,可以优化预期目标的几何。目标几何形状可以具有许多不同的形状,包括梯形,圆柱形,抛物线形和椭圆形,这取决于所需的最佳工艺参数。使用该方法开发了一种溅射系统,该溅射系统具有主磁体堆,旋转磁体,具有为控制腐蚀而优化的选定靶形状的靶,下游磁体,基板以及电场感应等离子体流。

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