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System for photometric calibration of optoelectronic imaging devices especially streak cameras

机译:用于光电成像设备(尤其是条纹相机)的光度校准系统

摘要

A system for the photometric calibration of streak cameras and similar imaging devices provides a precise knowledge of the camera's flat-field response as well as a mapping of the geometric distortions. The system provides the flat-field response, representing the spatial variations in the sensitivity of the recorded output, with a signal-to-noise ratio (SNR) greater than can be achieved in a single submicrosecond streak record. The measurement of the flat-field response is carried out by illuminating the input slit of the streak camera with a signal that is uniform in space and constant in time. This signal is generated by passing a continuous wave source through an optical homogenizer made up of a light pipe or pipes in which the illumination typically makes several bounces before exiting as a spatially uniform source field. The rectangular cross-section of the homogenizer is matched to the usable photocathode area of the streak tube. The flat-field data set is obtained by using a slow streak ramp that may have a period from one millisecond (ms) to ten seconds (s), but may be nominally one second in duration. The system also provides a mapping of the geometric distortions, by spatially and temporarily modulating the output of the homogenizer and obtaining a data set using the slow streak ramps. All data sets are acquired using a CCD camera and stored on a computer, which is used to calculate all relevant corrections to the signal data sets. The signal and flat-field data sets are both corrected for geometric distortions prior to applying the flat-field correction. Absolute photometric calibration is obtained by measuring the output fluence of the homogenizer with a “standard-traceable” meter and relating that to the CCD pixel values for a self-corrected flat-field data set.
机译:条纹相机和类似成像设备的光度校准系统可提供有关相机平场响应以及几何变形映射的精确知识。该系统提供的平场响应表示记录的输出灵敏​​度的空间变化,信噪比(SNR)大于单个亚微秒条纹记录中所能达到的。通过用空间均匀且时间恒定的信号照亮条纹相机的输入狭缝来执行平场响应的测量。通过使连续波源通过由一根或多根光导管组成的光均化器来生成此信号,在该光均化器中,照明通常会反弹几次,然后作为空间均匀的源场出射。均质器的矩形横截面与条纹管的可用光电阴极面积匹配。平场数据集是通过使用缓慢的条纹坡道获得的,该条纹坡道的周期可能从一毫秒(ms)到十秒(s),但标称持续时间可能是一秒钟。该系统还通过在空间上临时调制均化器的输出并使用慢条纹斜率获得数据集来提供几何变形的映射。所有数据集均使用CCD摄像机采集并存储在计算机中,该计算机用于计算信号数据集的所有相关校正。在应用平场校正之前,信号和平场数据集都针对几何失真进行了校正。绝对光度校准是通过使用“标准可追溯”标准仪测量均化器的输出通量来获得的。仪表,并将其与自校正平场数据集的CCD像素值相关。

著录项

  • 公开/公告号US6642499B1

    专利类型

  • 公开/公告日2003-11-04

    原文格式PDF

  • 申请/专利权人 THE UNIVERSITY OF ROCHESTER;

    申请/专利号US19990356932

  • 发明设计人 PAUL JAANIMAGI;ROBERT BONI;

    申请日1999-07-19

  • 分类号H01J401/40;

  • 国家 US

  • 入库时间 2022-08-22 00:04:46

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