首页> 外国专利> Device for geometric calibration of optoelectronic measurement image cameras has an arrangement for producing a defined test structure in the form of a slit diaphragm

Device for geometric calibration of optoelectronic measurement image cameras has an arrangement for producing a defined test structure in the form of a slit diaphragm

机译:用于光电测量图像摄像机的几何校准的装置具有用于产生狭缝光阑形式的确定的测试结构的装置

摘要

The device (1) has a coherent, monochromatic light source and at least one arrangement for producing a defined test structure, whereby an image of the generated test structure is formed by the optics of the image camera (4) on its focal plane. The arrangement for producing the defined test structure is in the form of a slit diaphragm. An independent claim is also included for a method of geometric calibration of optoelectronic measurement cameras.
机译:装置(1)具有相干的单色光源和至少一个用于产生确定的测试结构的装置,其中,所产生的测试结构的图像由图像摄像机(4)的光学器件在其焦平面上形成。用于产生确定的测试结构的装置为狭缝隔膜的形式。还包括针对光电测量相机的几何校准方法的独立权利要求。

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