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METHOD FOR THE FABRICATION OF SILICON NITRIDE, SILICON OXYNITRIDE, AND SILICON OXIDE FILMS BY CHEMICAL VAPOR DEPOSITION

机译:化学气相沉积法制备氮化硅,氧化硅和氧化硅薄膜的方法

摘要

PROBLEM TO BE SOLVED: To provide a method for manufacturing a silicon nitride film, a silicon oxynitride film, or a silicon oxide film, of little hydrogen and carbon content, without generating ammonium chloride, even at a low temperature by a CVD method.;SOLUTION: This manufacturing method is characterized by using at least one compound selected from the group consisting of tetrakis(hydrocarbylamino) silane indicated by the formula: Si(NHRi)4 and tris(hydrocarbylamino)silane indicated in the formula: SiH(NHRi)3, (wherein each Ri is a 1-4C hydrocarbon group) for a precursor of the silicon nitride film, the silicon oxynitride film, or the silicon oxide film.;COPYRIGHT: (C)2003,JPO
机译:解决的问题:提供一种即使在低温下通过CVD法也不会产生氯化铵,且氢和碳含量少,且不产生氯化铵的氮化硅膜,氧氮化硅膜或氧化硅膜的制造方法。解决方案:该制造方法的特征在于,使用至少一种化合物,该化合物选自下式:Si(NHR i 4 表示的四(烃基氨基)硅烷式:SiH(NHR i 3 表示的三(烃基氨基)硅烷,其中每个R i 是一个1-4C烃基)作为氮化硅膜,氮氧化硅膜或氧化硅膜的前驱体。;版权:(C)2003,JPO

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