首页> 外国专利> METHOD FOR EVALUATING SYSTEM-ON-CHIP (SOC) HAVING CORE AS ITS BASE AND SOC STRUCTURE USING THE EVALUATION METHOD

METHOD FOR EVALUATING SYSTEM-ON-CHIP (SOC) HAVING CORE AS ITS BASE AND SOC STRUCTURE USING THE EVALUATION METHOD

机译:基于评估的基于核的片上系统(SOC)评估方法及SOC结构

摘要

A method for inspecting the cores of a system-on-chip (SoC) of a core base with high observability and high accuracy and an SoC structure realizing the inspecting method. In the method, a pad frame having two or more metal layers are provided to each core in an SoC, I/O (input/output) pads in a lower metal layer is connected to the top metal layer. Thus, all the I/O pads and power supply pads are provided on the top metal layer of the pad frame of each core. A test vector is fed to each core through the I/O pads of the top metal layer, and the response output from the core is received through the I/O pads to evaluate the core.
机译:一种具有高可观察性和高精度的核心库系统级芯片的核查方法及实现该检测方法的SoC结构。在该方法中,具有两个或更多个金属层的焊盘框架被提供给SoC中的每个核心,下部金属层中的I / O(输入/输出)焊盘被连接到顶部金属层。因此,所有I / O焊盘和电源焊盘都设置在每个核心的焊盘框架的顶部金属层上。测试矢量通过顶部金属层的I / O焊盘馈送到每个内核,并且通过I / O焊盘接收来自内核的响应输出以评估内核。

著录项

  • 公开/公告号WO02093640A1

    专利类型

  • 公开/公告日2002-11-21

    原文格式PDF

  • 申请/专利权人 ADVANTEST CORPORATION;

    申请/专利号WO2002JP04555

  • 发明设计人 RAJUSMAN ROCHIT;

    申请日2002-05-10

  • 分类号H01L21/66;G01R31/28;H01L27/04;

  • 国家 WO

  • 入库时间 2022-08-21 23:55:32

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号