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OPTOELECTRONIC APPARATUS FOR THE DIMENSION AND/OR SHAPE CHECKING OF PIECES WITH COMPLEX TRIDIMENSIONAL SHAPE

机译:具有复杂三维形状的零件的尺寸和/或形状检查的光电装置

摘要

An optoelectronic apparatus for the dimension and/or shape checking of pieces, more specifically pieces with complex tridimensional shape, as the supports for magnetic read/write heads (33, 47, 63) for hard disk storage units, comprises a base (1) with two guide elements (7, 9) to which there is coupled a slide (11), movable in a longitudinal direction along the guide elements (7, 9), and a system (31) for locking and referring the piece (33, 47, 63) to be checked. The slide (11) supports a rotary table (13), to which there is fixed a support (15) for an optoelectronic measuring system. Rotational displacements of the rotary table (13) about an axis parallel to the guide elements (7, 9) make the optoelectronic measuring system oscillate substantially in a plane perpendicular to said axis for optimizing the reciprocal arrangement between the components (75, 77) of the optoelectronic measuring system and the piece (33, 47, 63) in the course of the checking. It is possible to check pieces (33, 47, 63) with different shape and nominal dimensions by replacing just some elements of the apparatus.
机译:作为用于硬盘存储单元的磁读/写头(33、47、63)的支撑件的,用于检查零件(更具体地讲具有复杂三维形状的零件)的尺寸和/或形状的光电设备包括底座(1)具有两个导向元件(7、9),在该导向元件上连接有一个可沿纵向方向沿着导向元件(7、9)移动的滑块(11),以及用于锁定和定位工件(33, 47、63)进行检查。滑块(11)支撑转台(13),用于光电测量系统的支架(15)固定在该转台上。旋转工作台(13)围绕平行于导向元件(7、9)的轴线的旋转位移使光电测量系统基本上在垂直于所述轴线的平面内振荡,从而优化了组件(75、77)之间的相互布置。在检查过程中使用光电测量系统和零件(33、47、63)。只需更换设备的某些元件,就可以检查形状和公称尺寸不同的零件(33、47、63)。

著录项

  • 公开/公告号EP1029219B1

    专利类型

  • 公开/公告日2003-07-23

    原文格式PDF

  • 申请/专利权人 MARPOSS SPA;

    申请/专利号EP19980955424

  • 发明设计人 DANIELLI FRANCO;

    申请日1998-10-09

  • 分类号G01B11/24;G01B11/00;

  • 国家 EP

  • 入库时间 2022-08-21 23:52:53

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