首页> 外国专利> METHOD FOR INCREASING THE VERY-LARGE-SCALE-INTEGRATED VLSI CAPACITOR SIZE ON BULK SILICON AND SILICON-ON-INSULATOR SOI WAFERS AND STRUCTURE FORMED THEREBY

METHOD FOR INCREASING THE VERY-LARGE-SCALE-INTEGRATED VLSI CAPACITOR SIZE ON BULK SILICON AND SILICON-ON-INSULATOR SOI WAFERS AND STRUCTURE FORMED THEREBY

机译:散装硅和绝缘硅上硅片上超大型集成的VLSI电容器尺寸的增大方法及其结构

摘要

A method of forming a semiconductor device includes forming at least one conductive island having a predetermined sidewall angle on a conductive substrate, forming a dielectric material over the at least one conductive island, and forming the at least one conductive island and the conductive material. Forming a contact to the furnace.
机译:一种形成半导体器件的方法,包括:在导电衬底上形成具有预定侧壁角的至少一个导电岛;在所述至少一个导电岛上形成电介质材料;以及形成所述至少一个导电岛和所述导电材料。与炉子形成接触。

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