首页> 外国专利> ONE-TIME PROGRAMMABLE MEMORY USING FUSE/ANTI-FUSE AND VERTICALLY ORIENTED FUSE UNIT MEMORY CELLS

ONE-TIME PROGRAMMABLE MEMORY USING FUSE/ANTI-FUSE AND VERTICALLY ORIENTED FUSE UNIT MEMORY CELLS

机译:使用保险丝/反保险丝和垂直定向的保险丝单元存储器的一次性可编程存储器

摘要

PURPOSE: A one-time programmable memory array is provided to form a high density one-time programmable(OTP) memory at a remarkably low cost by greatly reducing the size of an individual unit memory cell. CONSTITUTION: The OTP memory includes one or more memory arrays stacked on top of each other. The OTP memory array is a cross-point array where unit memory cells are formed at the cross-points. The unit memory cell may include a fuse and an anti-fuse in series with each other or may include a vertically oriented fuse. Unit memory cells are selected and a writing voltage is applied to make a critical voltage drop across the selected cells occur so that the memory is programmed. This causes the anti-fuse of the cell to break down to a low resistance. The low resistance of the anti-fuse causes a high current pulse to be delivered to the fuse, which in turn melts the fuse to an open state. Unit memory cells for reading are selected and a reading voltage is applied to the selected memory cells. Whether current is present or not is measured to read the memory. Equipotential sensing may be used to read the memory.
机译:目的:提供一种一次性可编程存储器阵列,通过显着降低单个单元存储单元的尺寸,以极低的成本形成高密度的一次性可编程(OTP)存储器。组成:OTP存储器包括一个或多个堆叠在一起的存储器阵列。 OTP存储器阵列是交叉点阵列,其中在交叉点处形成单位存储单元。单位存储单元可以包括彼此串联的熔断器和反熔丝,或者可以包括垂直定向的熔断器。选择单位存储单元,并施加写入电压以使所选单元上出现临界电压降,从而对存储器进行编程。这导致电池的反熔丝击穿到低电阻。反熔丝的低电阻使高电流脉冲传递到保险丝,从而使保险丝熔化到断开状态。选择用于读取的单位存储单元,并且将读取电压施加到所选择的存储单元。测量是否存在电流以读取存储器。等电位感测可用于读取存储器。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号