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Post exposure bake apparatus and post exposure bake method using the same

机译:曝光后烘烤设备和使用该设备的曝光后烘烤方法

摘要

PURPOSE: A post exposure bake apparatus and a post exposure bake method using the same are provided to be capable of preventing the abrupt temperature change of a semiconductor wafer coated with an exposed photoresist layer in a chamber by conserving vacuum state under a bake process using a vacuum pump. CONSTITUTION: A hot plate(105) is installed in the lower portion of a chamber(101) for loading a wafer coated with an exposed photoresist layer. A wafer guide is installed at both edge portion of the hot plate for guiding and separating the wafer from the bottom portion of the hot plate. A shutter(109) is located at one side of the chamber for switching the chamber. A vacuum pump(119) is connected through a vacuum line(115) to the chamber for conserving the vacuum state of the chamber. A plurality of support pins(113) are located in through holes of the hot plate for moving the wafer up and down. A gas injecting line(116) is connected with the upper portion of the chamber for supplying inert gas.
机译:用途:提供一种后曝光烘烤装置和使用该装置的后曝光烘烤方法,其能够通过在使用以下方法的烘烤过程中保持真空状态来防止在腔室中涂覆有曝光的光致抗蚀剂层的半导体晶片的突然温度变化。真空泵。组成:热板(105)安装在腔室(101)的下部,用于装载涂有裸露的光刻胶层的晶圆。晶片导向器安装在加热板的两个边缘部分,用于将晶片从加热板的底部引导和分离。闸门(109)位于腔室的一侧,用于切换腔室。真空泵(119)通过真空管线(115)连接到腔室,以保持腔室的真空状态。多个支撑销(113)位于热板的通孔中,用于上下移动晶片。气体注入管线(116)与腔室的上部连接以供应惰性气体。

著录项

  • 公开/公告号KR20030048908A

    专利类型

  • 公开/公告日2003-06-25

    原文格式PDF

  • 申请/专利权人 KWON YOUNG JONG;YANG MYUNG HUN;

    申请/专利号KR20010078958

  • 发明设计人 KWON YOUNG JONG;YANG MYUNG HUN;

    申请日2001-12-13

  • 分类号H01L21/027;

  • 国家 KR

  • 入库时间 2022-08-21 23:46:50

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