Tester for mixed signal semiconductor device and method of testing thereof

摘要

PURPOSE: A semiconductor device tester for mixed signal and a test method using the same are provided to process a mixed signal by adding a measurement module to an existing digital tester. CONSTITUTION: A semiconductor device tester for mixed signal includes a digital tester(110), a measurement module(130), and an interface line(120). The digital tester is controlled by the first controller. The digital tester is used for testing digital elements. The measurement module includes an analog source generator(132) for applying an analog signal, an analog waveform digitizer(136) for analyzing an analog signal as a digital signal, and a personal computer(134) including the second controller. The interface line is used for connecting the digital tester to the measurement module.