Semiconductor device for enhancing test of confidence limits

摘要

PURPOSE: A semiconductor device is provided to be capable of improving the test of confidence limits by using an improved fuse layout. CONSTITUTION: A fuse box is formed on a fuse part for blowing a fuse. A fuse guard ring is formed at peripheral region of the fuse box for preventing moisture from attacking into a peripheral circuit via the fuse box. At this time, the fuse guard ring maintained to the floating state for applying the same voltage into the fuse guard ring and the fuse. The fuse is made of titanium nitride.