INTEGRATED CIRCUIT BURN-IN TEST APPARATUS HAVING CONNECTION FAIL CHECK MODE, PROBING BOARD AND METHOD FOR CHECKING CONNECTION FAIL

摘要

PURPOSE: An integrated circuit burn-in apparatus having a connection inspecting function is provided to automatically inspect an electrical connection state before inspecting an integrated circuit or while the inspection process is performed. CONSTITUTION: A control unit controls an inspection process and a connection inspecting process of a predetermined semiconductor integrated circuit. A driving unit is connected to the control unit, and generates a driving signal for an inspection process of the integrated circuit and the connection inspecting process by a control signal of the control unit. A line transmits the driving signal, connected to the driving unit. A test board is connected to the line, and has a circuit for performing a test of a characteristic according to the specification of the integrated circuit and a circuit for inspecting whether an electrical connection with the driving unit through the line is normal.