首页> 外国专利> Production of vertically doubled diffused MOS transistor comprises forming gate oxide layer on wafer, depositing polysilicon layer on wafer, applying further oxide layer, structuring, and further processing

Production of vertically doubled diffused MOS transistor comprises forming gate oxide layer on wafer, depositing polysilicon layer on wafer, applying further oxide layer, structuring, and further processing

机译:垂直倍增的扩散MOS晶体管的生产包括在晶片上形成栅极氧化层,在晶片上沉积多晶硅层,再施加氧化物层,结构化和进一步处理

摘要

The production of a vertically doubled diffused MOS transistor comprises forming a gate oxide layer (3) on a wafer (1); depositing a polysilicon layer (4) on the wafer; applying a further oxide layer; structuring the three-layer system formed; forming a sink region (5) by ion implantation and high temperature diffusion; forming a source region (6) in the sink region; depositing a further oxide layer; anisotropically plasma-chemical etching to remove the further oxide layer; anisotropically etching to form a trench by separating the source region and exposing the sink region using a spacer oxide; isotropically etching the spacer oxide in the lateral and vertical direction; and metallizing. An Independent claim is also included for a MOS transistor produced by the above process.
机译:垂直倍增的扩散MOS晶体管的生产包括在晶片(1)上形成栅极氧化物层(3);以及在晶片上沉积多晶硅层(4);施加另外的氧化物层;构建所形成的三层体系;通过离子注入和高温扩散形成凹陷区(5);在吸收区中形成源极区(6);沉积另外的氧化物层;各向异性等离子体化学蚀刻,以去除另外的氧化物层;通过隔离源极区并使用隔离层氧化物暴露阱区来各向异性刻蚀以形成沟槽;在横向和垂直方向上各向同性地蚀刻间隔氧化物;和金属化。通过上述工艺制造的MOS晶体管也包括独立权利要求。

著录项

  • 公开/公告号DE10134546A1

    专利类型

  • 公开/公告日2003-02-06

    原文格式PDF

  • 申请/专利权人 X-FAB GESELLSCHAFT ZUR FERTIGUNG VON WAFERN MBH;

    申请/专利号DE2001134546

  • 发明设计人 LERNER RALF;

    申请日2001-07-16

  • 分类号H01L29/78;H01L21/336;

  • 国家 DE

  • 入库时间 2022-08-21 23:42:54

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