首页> 外国专利> Device for X-ray diagnostics has an imaging system to process images in advance and to correct them as well as an evaluatory device to determine functions and classes of function suitable for correcting/equalizing the X-ray images

Device for X-ray diagnostics has an imaging system to process images in advance and to correct them as well as an evaluatory device to determine functions and classes of function suitable for correcting/equalizing the X-ray images

机译:用于X射线诊断的设备具有用于预先处理图像并对其进行校正的成像系统,以及用于确定适合于校正/均衡X射线图像的功能和功能类别的评估设备

摘要

An imaging system processes images in advance in order to correct/equalize them. It has an evaluatory device (ED) that corresponds to a device for processing the images in advance. The ED also determines functions and classes of function suitable for correcting/equalizing X-ray images. A mathematical function is defined. A Vapnik Chervonenkis dimension is calculated. A quality limit is set and minimized. An Independent claim is also included for a method for an imaging system for correcting X-ray images.
机译:成像系统预先处理图像以便校正/均衡图像。它具有评估装置(ED),该评估装置对应于预先处理图像的装置。 ED还确定适合于校正/均衡X射线图像的功能和功能类别。定义了数学函数。计算Vapnik Chervonenkis尺寸。设置质量限制并将其最小化。还包括针对用于校正X射线图像的成像系统的方法的独立权利要求。

著录项

  • 公开/公告号DE10141085A1

    专利类型

  • 公开/公告日2003-05-15

    原文格式PDF

  • 申请/专利权人 SIEMENS AG;

    申请/专利号DE2001141085

  • 发明设计人 HORNEGGER JOACHIM;

    申请日2001-08-22

  • 分类号A61B6/00;G03B42/02;H04N5/325;

  • 国家 DE

  • 入库时间 2022-08-21 23:42:41

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