Reducing power consumption in dynamic random access memory uses test control signal to decouple test module in operating module for circuit from wire/connector so as to avoid switching currents in the test module

摘要

A test module (30) set up for testing an electronic circuit connects to a wire (38,40) and/or a connector for the electronic circuit. A test control signal (34) is generated, with which the test module in an operating module for the electronic circuit is decoupled from the wire or the connector in such a way that switching currents are avoided in the test module. An Independent claim is also included for a device for reducing power consumption in an electronic circuit.