首页> 外国专利> Circuit structure for reducing surge voltages during switching processes on an engaging or non-engaging insulated gate bipolar transistor (IGBT) generates a gate current to protect the IGBT

Circuit structure for reducing surge voltages during switching processes on an engaging or non-engaging insulated gate bipolar transistor (IGBT) generates a gate current to protect the IGBT

机译:用于在啮合或非啮合绝缘栅双极晶体管(IGBT)上进行开关过程期间降低浪涌电压的电路结构会产生栅极电流以保护IGBT

摘要

Voltage is measured on an insulated gate bipolar transistor (IGBT). If a certain reference voltage is exceeded, a switch opens. A current conduction is formed via an energy store (K) and a first diode (D1) turns into a gate (G) for the IGBT, which has an anti-parallel recovery diode (D2) and acts as an electronic switching device. After a set time and the IGBT is switched off, the switch closes. An Independent claim is also included for a method for reducing surge voltages during switching processes on an engaging or non-engaging insulated gate bipolar transistor.
机译:在绝缘栅双极型晶体管(IGBT)上测量电压。如果超过某个参考电压,则会打开一个开关。电流通过储能器(K)形成,第一二极管(D1)变成IGBT的栅极(G),该栅极具有反并联恢复二极管(D2),并用作电子开关设备。在设定的时间后,IGBT关闭,开关闭合。还包括一种用于在接合或非接合绝缘栅双极晶体管上的开关过程期间减小浪涌电压的方法的独立权利要求。

著录项

  • 公开/公告号DE10204041A1

    专利类型

  • 公开/公告日2003-08-14

    原文格式PDF

  • 申请/专利权人 SIEMENS AG;

    申请/专利号DE20021004041

  • 发明设计人 BRAUN MATTHIAS;WEIS BENNO;

    申请日2002-02-01

  • 分类号H02M1/00;

  • 国家 DE

  • 入库时间 2022-08-21 23:42:12

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