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Method and apparatus for performing sequential method, the different lengths of time is necessary, in the production of a semiconductor device

机译:用于执行顺序方法的方法和装置,在半导体器件的生产中,需要不同的时间长度

摘要

A method of manufacturing a semiconductor device contains a first and second method, wherein the latter requires a longer processing time. A device for carrying out of the half conductor production process includes a first reactor and a plurality of second reactors for each first reactor. A first group of wafers passes through the first process within the first reactor and is then transported in a second reactor, which is insulated with respect to the outside air. The first group of wafers, passes through the second method within the second reactor. For the same time passes through a second group of wafers the first method within the first reactor. After the first method has been completed, the second group of wafers are transported in one of the second reactors, which is not occupied, and specifically in a relative to the ambient air insulated state. There passes through the second group of wafers the second method. Accordingly, errors, which would otherwise occur due to the contact of the wafer with oxygen, for example, be caused in the air be minimized, and the productivity is in spite of the difference in the case of the processing times high.
机译:制造半导体器件的方法包括第一和第二方法,其中后者需要更长的处理时间。用于进行半导体生产过程的设备包括第一反应器和用于每个第一反应器的多个第二反应器。第一组晶片在第一反应器内经过第一过程,然后在相对于外部空气绝缘的第二反应器中运输。第一组晶片在第二个反应器内通过第二种方法。同时,通过第一反应器内的第二种晶片通过第二组晶片。在完成第一种方法之后,将第二组晶圆在一个未被占用的第二反应器中运输,特别是相对于环境空气绝缘状态。第二种方法穿过第二组晶片。因此,使由于晶片与氧气的接触而在空气中引起的误差最小化,尽管在处理时间高的情况下生产率有所不同,但是生产率仍然很高。

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