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Manipulator for positioning test head on test device, e.g. for semiconductor device handler or wafer prober and carrying beam with fixing points to allow attachment of cross-arms at variable positions
Manipulator for positioning test head on test device, e.g. for semiconductor device handler or wafer prober and carrying beam with fixing points to allow attachment of cross-arms at variable positions
A carrying beam (21) is supported on at least two cross-arms which are releasably connected to the carrying beam. The carrying beam includes a number of fixing points on which the cross-arms can be attached at variable positions in the longitudinal direction.
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