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Equipment supplying two or more gases from five sources to trace impurity analyzers, includes appropriate pipework and valves for connection with purge system

机译:从五种气体源供应两种或多种气体到痕量杂质分析仪的设备,包括适当的管道系统和与吹扫系统连接的阀门

摘要

A supply line (LF) takes gas to and is connected to the analyzer (AP). The other end is connected to a purge line (LpLF) for it (LP). Sampling lines are connected to the sources (A, B, C, D, E) or to a purge line using appropriate valves (vA-vE). Further interconnection valves (VA-VE) complete the circuit and are provided with change-over actuators. A source of inert gas (SG) is provided. Each purge line downstream of the sampling lines is connected to the source of inert gas and comprises an offtake for general purging, controlled by a take-off valve (Vd). Vent valves are provided on the purge line for the supply line and the purge lines upstream of the sampling lines. Purge offtakes are located downstream of the sampling lines placed between the source of inert gas and the offtake valve. The circuitry is further detailed in accordance with the foregoing principles. Connection is made to analyzers having differing sensitivities.
机译:一条供气管线(LF)将气体吸入并连接到分析仪(AP)。另一端连接到它的吹扫管线(LpLF)(LP)。采样管线使用适当的阀门(vA-vE)连接到信号源(A,B,C,D,E)或吹扫管线。另外的互连阀(VA-VE)构成回路,并配有转换执行器。提供了惰性气体源(SG)。采样管线下游的每条吹扫管线均与惰性气体源相连,并包括一个由排放阀(Vd)控制的一般吹扫管线。在进样管线的进样管线和进样管线上游的进样管线上设有排气阀。排放口位于惰性气体源和排放阀之间的采样管线的下游。根据前述原理进一步详细说明该电路。连接到具有不同灵敏度的分析仪。

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