PHOTOCATALYST COATING SOLUTION AND METHOD FOR MEASURING FILM THICKNESS OF PHOTOCATALYST LAYER WITH FLUORESCENT X-RAY SPECTROSCOPY AND QUALITY CONTROL USING THE SAME

摘要

PROBLEM TO BE SOLVED: To measure the film thickness of photocatalyst layers with fluorescent X-ray spectroscopy and the quality control using the same.;SOLUTION: To the photocatalyst coating liquid, is added a compound of an element (M) that is detectable with the fluorescent X-ray spectroscopy, different from the elements of the photocatalyst coating film components, the photocatalyst protecting layer components and the photocatalyst components. The resultant photocatalyst coating liquid is used to form the photocatalyst layers on the paint-coated layer formed on the surface of the substrate. Then, the measurement of the film thickness of the photocatalyst and the quality control are carried out by measuring the X-ray intensity of the M element through the fluorescent X-ray spectroscopy. Even in the case where the paint-coated layer includes the components of the photocatalyst, the thickness of the photocatalyst can exactly measured from the X-ray intensity of the M element and the quality control of the photocatalyst layer also can be carried out in high precision.;COPYRIGHT: (C)2005,JPO&NCIPI