APPARATUS AND OSCILLATING METHOD FOR TWO-WAVELENGTH TYPE SEMICONDUCTOR LASER, AND MEASURING APPARATUS AND METHOD FOR TWO-WAVELENGTH TYPE INTERFERENCE

摘要

PROBLEM TO BE SOLVED: To provide a two-wavelength type semiconductor-laser light source wherein two wavelengths are generated by a semiconductor laser, and its measurement scope is made wide, and further, its constitution is made simple.;SOLUTION: A semiconductor laser 1 has a mode-hop generating property wherein the wavelength of its output beam is varied in response to the variations of its injection current and its temperature, and the wavelength of its output beam is varied step-wise at a certain current and temperature. A temperature controller 2 so controls the temperature of the semiconductor laser 1 that it coincides with the temperature to initiate the mode-hop, and brings the semiconductor laser 1 into the state of outputting beams including two different wavelengths present before and behind the mode-hop. A current controller 3 so controls in the foregoing state the injection current or voltage fed to the semiconductor laser 1 that the beam having either one of the two different wavelengths is outputted selectively from it.;COPYRIGHT: (C)2004,JPO&NCIPI