首页> 外国专利> METHOD OF ELECTRON BEAM LITHOGRAPHY, METHOD FOR MANUFACTURING MATRIX, MATRIX, METHOD FOR MANUFACTURING MOLD, MOLD, OPTICAL ELEMENT, AND ELECTRON BEAM LITHOGRAPHY APPARATUS

METHOD OF ELECTRON BEAM LITHOGRAPHY, METHOD FOR MANUFACTURING MATRIX, MATRIX, METHOD FOR MANUFACTURING MOLD, MOLD, OPTICAL ELEMENT, AND ELECTRON BEAM LITHOGRAPHY APPARATUS

机译:电子束光刻技术,制造矩阵的方法,矩阵,制造模具,模具,光学元件的方法以及电子束光刻设备

摘要

PROBLEM TO BE SOLVED: To provide a method of electron beam lithography by which processing errors accumulated in other steps are eliminated and corrected and a diffractive structure providing predetermined optical performances can be drawn.;SOLUTION: For example, when the error δt of height position of the object face for lithography (a curved face part 100a) is positive, the dose Dm for drawing the part is controlled to be larger for lithography by the degree corresponding to the error δt than the designed dose D0. When the error δt is negative, the dose Dm for lithography is controlled to be smaller for plotting by the degree corresponding to the error δt than the designed dose D0. Thereby, the process error (the error δt1 of the height position on the mother optical face 110a from the designed value) in a shaping step or the process error in a resist forming step (the error δt2 in the film thickness of a resist applied on the mother optical face 110a from a specified thickness) are eliminated and a given profile can be obtained. That is, a diffractive structure with which specified optical performances can be obtained can be drawn.;COPYRIGHT: (C)2004,JPO&NCIPI
机译:解决的问题:提供一种电子束光刻方法,通过该方法可以消除和校正在其他步骤中积累的处理误差,并且可以绘制出提供预定光学性能的衍射结构。用于光刻的物体表面(曲面部分100a)的高度位置为正,用于绘制该部分的剂量Dm被控制为用于光刻的比设计的剂量D0大与误差δt相对应的程度。当误差δt为负时,用于光刻的剂量Dm被控制为比设计剂量D0小对应于误差δt的程度。从而,在成形步骤中的处理误差(母光学面110a上的高度位置的误差Δt1与设计值相比)或在抗蚀剂形成步骤中的处理误差(膜厚度的误差Δt2)。除去从母光学面110a以规定的厚度施加的抗蚀剂,可以得到给定的轮廓。即,可以画出可以得到规定的光学性能的衍射结构。COPYRIGHT:(C)2004,JPO&NCIPI

著录项

  • 公开/公告号JP2004272031A

    专利类型

  • 公开/公告日2004-09-30

    原文格式PDF

  • 申请/专利权人 KONICA MINOLTA HOLDINGS INC;

    申请/专利号JP20030064444

  • 发明设计人 MASUDA OSAMU;FURUTA KAZUMI;

    申请日2003-03-11

  • 分类号G03F7/20;G02B5/18;G11B7/135;G11B7/22;H01J37/04;H01J37/147;H01J37/305;H01L21/027;

  • 国家 JP

  • 入库时间 2022-08-21 23:32:49

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