ELECTRICAL CHARACTERISTIC MEASURING DEVICE AND ELECTRICAL CHARACTERISTIC MEASURING METHOD OF SEMICONDUCTOR DEVICE

摘要

PROBLEM TO BE SOLVED: To surely bring two measuring contacts into contact with a lead terminal without being influenced by size dispersion of the lead terminal.;SOLUTION: This device is equipped with a first measuring contact 5 to be brought into contact with the lower surface of the lead terminal 3, and a second measuring contact 7 to be brought into contact with the outside side surface of a vertical part of the lead terminal 3, relative to one lead terminal 3 of a semiconductor device 1 equipped with the lead terminal 3 drawn out from the package side surface in the horizontal direction and bent vertically. Hereby, the two measuring contacts 5, 7 can be brought into contact with the lead terminal 3 without being influenced by the size dispersion of the lead terminal 3.;COPYRIGHT: (C)2004,JPO