Program products and systems and methods for testing hierarchical design, for implementing the method, and an integrated circuit produced by this method

摘要

Method used for hierarchical design of the integrated circuit having at least one module having a combination of logic and functional memory device, scan memory can be set to capture mode and scan mode, a description of the functional memory devices of the module a step of replacing the description of the device, by converting the description of the scannable peripheral memory device configurable internal test mode, the normal operation mode and the external test mode, the description of the scannable functional memory element is selected, a step of dividing the peripheral compartment and inner compartment module, if it is set to the internal test mode, with is controlled by the module test controller associated with, the internal memory device and can be scanned around the modules, the external test mode If it is set to, the scan chain as controlled, scannable memory elements in the peripheral module, and a step of configuring the scanning memory device by the test controller higher.