首页> 外国专利> MASS SPECTROMETRIC SYSTEM, METHOD OF MASS SPECTROMETRY, AND MASS SPECTROMETER

MASS SPECTROMETRIC SYSTEM, METHOD OF MASS SPECTROMETRY, AND MASS SPECTROMETER

机译:质谱仪,质谱仪和质谱仪

摘要

PROBLEM TO BE SOLVED: To provide a tandem mass spectrometer which can perform tandem mass spectrometry on a trace quantity of a sample to be analyzed with a system selecting ions to be analyzed or ions not to be analyzed together with the ions to be analyzed before a first stage mass spectrometry, even when a large quantity of foreign components are mixed into the sample.;SOLUTION: The mass spectrometry uses a first database storing data of candidate substances to be analyzed, and a high frequency power source applying a high frequency voltage to the substances to eliminate the ions not to be analyzed. Before a first stage mass spectrometry, the ions not to be analyzed are not listed in the first database or ions other than the ions to be analyzed coincident with those of a second database storing the data of candidate substances not to be analyzed are eliminated by the high frequency voltage, and then the mass spectrometry is performed.;COPYRIGHT: (C)2004,JPO
机译:解决的问题:提供一种串联质谱仪,该串联质谱仪可以使用选择待分析离子或不待分析离子以及待分析离子的系统对痕量待分析样品进行串联质谱分析。一级质谱分析法,即使样品中混有大量异物也是如此;解决方案:质谱分析法使用存储有待分析候选物质数据的第一数据库,以及将高频电压施加到样品上的高频电源消除不需要分析的离子的物质。在第一阶段质谱分析之前,未分析的离子未在第一数据库中列出,或者要分析的离子与与存储未分析的候选物质数据的第二数据库的离子相一致的待分析离子以外的其他离子将被清除。高频电压,然后进行质谱分析。;版权所有:(C)2004,日本特许厅

著录项

  • 公开/公告号JP2004071420A

    专利类型

  • 公开/公告日2004-03-04

    原文格式PDF

  • 申请/专利权人 HITACHI LTD;

    申请/专利号JP20020230757

  • 发明设计人 HIRABAYASHI TSUDOI;UCHIDA NORITAKA;

    申请日2002-08-08

  • 分类号H01J49/26;G01N27/62;H01J49/40;H01J49/42;

  • 国家 JP

  • 入库时间 2022-08-21 23:26:01

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