首页> 外国专利> The identification of one base poly dies by the electronic dot blotting assay with respect to semiconductor microchip

The identification of one base poly dies by the electronic dot blotting assay with respect to semiconductor microchip

机译:通过电子斑点印迹法对半导体微芯片鉴定一种基础多晶

摘要

A rapid assay for single nucleotide polymorphism (SNP) detection that utilizes electronic circuitry on silicon microchips is disclosed. The method provides accurate discrimination of amplified DNA samples following electronic assisted transport, concentration, and attachment of DNA to selected electrodes (test sites). The test sites make up organized arrays of samples that are distinguished by using internal controls of dual labeled reporters comprising wild-type and mismatched sequences to validate the SNP genotype. This method has been used to discriminate the complex quadra-allelic SNP of mannose binding protein.
机译:公开了一种利用硅微芯片上的电子电路的单核苷酸多态性(SNP)检测的快速测定法。该方法可在电子辅助转运,浓缩和将DNA附着到选定电极(测试位点)之后,准确区分扩增的DNA样品。测试部位组成了样品的有组织阵列,这些样品的阵列通过使用包含野生型和错配序列的双重标记报道分子的内部对照来区分,以验证SNP基因型。该方法已用于区分甘露糖结合蛋白的复杂四等位基因SNP。

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