首页> 外国专利> Mask set for compensating a misalignment between patterns and method of compensating a misalignment between patterns using the same

Mask set for compensating a misalignment between patterns and method of compensating a misalignment between patterns using the same

机译:用于补偿图案之间的未对准的掩模组以及使用该掩模组补偿图案之间的未对准的方法

摘要

The present invention discloses a mask set for compensating for a misalignment between the patterns and method of compensating for a misalignment between the patterns. A mask set of the present invention comprises a first mask consisted of a mask substrate on which a main pattern and a plurality of sub-patterns are formed, said sub-patterns formed at a side of the main pattern; a second mask consisted of a mask substrate on which a plurality of hole patterns are formed, the hole patterns corresponded to spaces between the main pattern and the sub-patterns of the first mask, respectively when the first and second mask are overlapped to each other; and a third mask consisted of mask substrate on which a plurality of bar patterns are formed, the bar patterns corresponded to the hole patterns of the second mask, respectively when the second and third mask are overlapped to each other.
机译:本发明公开了一种用于补偿图案之间的未对准的掩模组以及补偿图案之间的未对准的方法。本发明的掩模组包括第一掩模,该第一掩模由掩模基板组成,在该掩模基板上形成有主图案和多个子图案,所述子图案形成在主图案的侧面上。第二掩模由其上形成有多个孔图案的掩模基板组成,当第一掩模和第二掩模彼此重叠时,孔图案分别对应于第一掩模的主图案和子图案之间的间隔。 ;第3掩模由在其上形成有多个条状图案的掩模基板构成,当第2掩模和第3掩模相互重叠时,该条状图案分别与第2掩模的孔图案相对应。

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