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Terminating resistor device and a method for testing a terminating resistor circuit

机译:端接电阻器装置和测试端接电阻器电路的方法

摘要

An object of the present invention is to provide a terminating resistor device and a testing method, by which the resistance value of a terminating resistor circuit can be test effectively. The test procedure starts with setting a MUXSCANFF circuit which functions as a selecting circuit in scan mode for test. Then, input a test signal to the scan input and/or clock input. Thereby, a particular resistor element for one bit only is set ON. By detecting the resistance value of this resistor element that has been set ON, it is test whether the one-bit resistance element conforms to manufacturing specification. Select another one of the one-bit resistor elements in order and test each one-bit resistor element, thereby testing all resistor elements.
机译:本发明的目的是提供一种终端电阻器装置和测试方法,通过该终端电阻器装置和测试方法,可以有效地测试终端电阻器电路的电阻值。测试程序从设置MUXSCANFF电路开始,该电路在扫描模式下用作测试的选择电路。然后,将测试信号输入到扫描输入和/或时钟输入。由此,仅将一位的特定电阻器元件设为ON。通过检测已设置为ON的电阻元件的电阻值,可以测试一位电阻元件是否符合制造规格。按顺序选择一个一位电阻器元件并测试每个一位电阻器元件,从而测试所有电阻器元件。

著录项

  • 公开/公告号US2004150421A1

    专利类型

  • 公开/公告日2004-08-05

    原文格式PDF

  • 申请/专利权人 NEC ELECTRONICS CORPORATION;

    申请/专利号US20030747271

  • 发明设计人 HIDEMI NAKASHIMA;MASAKAZU KURISU;

    申请日2003-12-30

  • 分类号H03K19/003;

  • 国家 US

  • 入库时间 2022-08-21 23:19:59

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