首页> 外国专利> SELF ALIGNED METHOD OF FORMING A SEMICONDUCTOR MEMORY ARRAY OF FLOATING GATE MEMORY CELLS WITH BURIED FLOATING GATE, POINTED FLOATING GATE AND POINTED CHANNEL REGION, AND A MEMORY ARRAY MADE THEREBY

SELF ALIGNED METHOD OF FORMING A SEMICONDUCTOR MEMORY ARRAY OF FLOATING GATE MEMORY CELLS WITH BURIED FLOATING GATE, POINTED FLOATING GATE AND POINTED CHANNEL REGION, AND A MEMORY ARRAY MADE THEREBY

机译:一种自对准形成带有浮动门,点浮动门和点通道区域的浮动门存储单元的半导体存储阵列的方法,以及由此形成的存储阵列

摘要

A method of forming a floating gate memory cell array, and the array formed thereby, wherein a trench is formed into the surface of a semiconductor substrate. The source and drain regions are formed underneath the trench and along the substrate surface, respectively, with a non-linear channel region therebetween. The floating gate has a lower portion disposed in the trench and an upper portion disposed above the substrate surface and having a lateral protrusion extending parallel to the substrate surface. The lateral protrusion is formed by etching a cavity into an exposed end of a sacrificial layer and filling it with polysilicon. The control gate is formed about the lateral protrusion and is insulated therefrom. The trench sidewall meets the substrate surface at an acute angle to form a sharp edge that points toward the floating gate and in a direction opposite to that of the lateral protrusion.
机译:一种形成浮栅存储单元阵列的方法,以及由此形成的阵列,其中在半导体衬底的表面中形成沟槽。源极区和漏极区分别形成在沟槽下方并沿着衬底表面,并且在其间具有非线性沟道区。浮置栅极具有设置在沟槽中的下部和设置在基板表面上方并且具有平行于基板表面延伸的横向突起的上部。通过将腔蚀刻到牺牲层的暴露端中并用多晶硅填充来形成侧向突起。控制栅极围绕侧向突起形成并且与侧向突起绝缘。沟槽侧壁以锐角与基板表面相交,以形成尖锐的边缘,该尖锐的边缘指向浮动栅极并且在与横向突起的方向相反的方向上。

著录项

  • 公开/公告号US2004197996A1

    专利类型

  • 公开/公告日2004-10-07

    原文格式PDF

  • 申请/专利权人 CHEN BOMY;LEE DANA;

    申请/专利号US20030394975

  • 发明设计人 BOMY CHEN;DANA LEE;

    申请日2003-03-21

  • 分类号H01L21/336;

  • 国家 US

  • 入库时间 2022-08-21 23:19:45

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