A single-event upset immune flip-flop circuit is disclosed. The single-event upset immune flip-flop circuit includes a first single-event upset immune latch and a second single-event upset immune latch. The first single-event upset immune latch has two inputs and two outputs. The second single-event upset immune latch also has two inputs and two outputs. The two inputs of the second single-event upset immune latch is connected to the two outputs of the first single-event upset immune latch. The state of the first single-event upset immune latch changes only when the signal polarities at both inputs of the first single-event upset immune latch are identical. Similarly, the state of the second single-event upset immune latch changes only when the signal polarities at both inputs of the second single-event upset immune latch are identical.
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