首页> 外国专利> Solid state etalons with low thermally-induced optical path length change employing crystalline materials having significantly negative temperature coefficients of optical path length

Solid state etalons with low thermally-induced optical path length change employing crystalline materials having significantly negative temperature coefficients of optical path length

机译:热致光程长度变化低的固态标准具,采用光程长度温度系数明显为负的晶体材料

摘要

An etalon is disclosed comprising a first rutile or strontium titanate material having a first coefficient of thermal optical path length change &bgr;1 that has a negative value, coupled with a second material having a coefficient of thermal optical path length change &bgr;2 that is positive, and an optical path extending through the first material and the second material, such that the effective temperature coefficient of the optical path length is close to zero. Further, the total optical path length in the cavity gives a desired free spectral range of the etalon. Etalons composed of a single crystalline material are also disclosed. Such materials may include crystalline quartz.
机译:公开了一种标准具,其包括第一金红石或钛酸锶材料和第二材料,所述第一金红石或钛酸锶材料具有负值的第一热光程长度变化&bgr; 1 ;第二材料具有负光程。长度变化&bgr; 2 为正,并且光路延伸通过第一材料和第二材料,使得光路长度的有效温度系数接近于零。此外,腔中的总光程长度给出了标准具的所需自由光谱范围。还公开了由单晶材料组成的标准具。这样的材料可以包括晶体石英。

著录项

  • 公开/公告号US2004080832A1

    专利类型

  • 公开/公告日2004-04-29

    原文格式PDF

  • 申请/专利权人 SINGH MANDEEP;

    申请/专利号US20030606685

  • 发明设计人 MANDEEP SINGH;

    申请日2003-06-26

  • 分类号G02B27/00;

  • 国家 US

  • 入库时间 2022-08-21 23:17:04

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