Method for locating IDDQ defects using multiple controlled collapse chip connections current measurement on an automatic tester

摘要

A method for improving the signal-to-noise ratio in an I_DDQ defect test is disclosed. An integrated circuit is divided into a plurality of areas and each area is provided with and bounded by terminals. An I_DDQ defect is activated to generate I_DDQ defect current within the integrated circuit. An amount of I_DDQ defect current generated within each area is measured at the terminals provided thereto. Based on the I_DDQ current measurement on each area, an I_DDQ current map is created. By analyzing the I_DDQ current map, the presence and location of the defect is determined. Based on the determination, the I_DDQ defect is isolated.