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Structure composite-type test fixture

机译:结构复合式测试治具

摘要

An improved structure composite-type test fixture consisting of a stack planar postured flush against the upper surface of a probe board which is situated on the upper extent of a base such that holes predisposed in the face of the probe board provides for the entry of probe barrels. Comprised of a top board, a thickness board, and a pliant plastic board, the stack planar has through-holes predisposed in a certain alignment that provides for the insertion of probes to the various connection points of a circuit board being tested. The tips of the probes are in a range of different diameters and size specifications, the top extremities protrude from the upper surface of the stack planar, and the distal extremities consist of a single specification insert section that fit into the probe barrels. Each probe barrel has an internally disposed spring. A wire is connected to the bottom end of the spring and a copper pin terminates the remaining free end of the wire, enabling the insertion of the copper pin into the flat cable of a circuit tester. As such, the fixture structure of the invention herein is simple to manufacturer, of significantly reduced production cost, and capable of enhanced testing accuracy.
机译:一种改进的结构复合型测试夹具,包括与位于基座上部的探针板的上表面齐平的堆叠平面,从而使预先放置在探针板表面上的孔可以进入探针桶。由顶板,厚度板和柔软的塑料板组成,堆叠平面具有以一定对齐方式预先布置的通孔,这些通孔允许将探针插入要测试的电路板的各个连接点。探针的尖端具有不同的直径和尺寸规格范围,顶部末端从堆栈平面的上表面突出,而末端末端则由一个适合插入探针筒的单一规格插入部分组成。每个探头镜筒都有一个内部设置的弹簧。一根导线连接到弹簧的底端,铜针端接导线的其余自由端,从而可以将铜针插入电路测试仪的扁平电缆中。这样,本文的本发明的夹具结构对于制造商而言是简单的,其生产成本大大降低,并且能够提高测试精度。

著录项

  • 公开/公告号US6724207B1

    专利类型

  • 公开/公告日2004-04-20

    原文格式PDF

  • 申请/专利权人 CHEN TUNG-HAN;

    申请/专利号US20030384610

  • 发明设计人 TUNG-HAN CHEN;

    申请日2003-03-11

  • 分类号G01R310/20;

  • 国家 US

  • 入库时间 2022-08-21 23:13:59

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