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Amorphizing ion implant local oxidation of silicon (LOCOS) method for forming an isolation region

机译:非晶化硅离子注入局部氧化(LOCOS)方法形成隔离区

摘要

Within a local oxidation of silicon (LOCOS) method for forming a silicon oxide isolation region, there is first amorphized areally completely at least a surface sub-layer portion of a silicon layer within an isolation region location within the silicon layer defined by an oxidation mask layer formed over the silicon layer, to form an amorphized silicon region within the isolation region location. Thus, when thermally oxidizing the silicon layer having formed thereover the oxidation mask layer to form at least in part from the amorphized silicon region a silicon oxide isolation region, the silicon oxide isolation region is formed with an attenuated bird's beak extension.
机译:在用于形成氧化硅隔离区域的硅的局部氧化(LOCOS)方法中,首先在由氧化掩模限定的硅层内的隔离区域位置内,将硅层的至少表面硅层部分完全完全非晶化。形成在硅层上方的硅层,以在隔离区位置内形成非晶硅区。因此,当热氧化在其上形成有氧化掩模层的硅层以至少部分地从非晶硅区域形成氧化硅隔离区域时,氧化硅隔离区域形成为具有减弱的鸟喙延伸。

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