首页> 外国专利> Mark length selection apparatus, mark length selection method, maximum mark length detection apparatus, and maximum mark length detection method

Mark length selection apparatus, mark length selection method, maximum mark length detection apparatus, and maximum mark length detection method

机译:标记长度选择装置,标记长度选择方法,最大标记长度检测装置和最大标记长度检测方法

摘要

A mark length selection apparatus is provided with a mark length measuring unit for measuring mark lengths of a signal which is read from an optical disc; a mark length selection unit for dividing one of continuous two mark lengths by the other mark length, which mark lengths are measured by the mark length measuring unit, and selecting some mark lengths from the mark lengths measured by the mark length measuring unit, on the basis of a result of comparison performed between a result of the division and a predetermined threshold value, and outputting the selected mark lengths; and a maximum mark length detection unit for detecting a maximum mark length that is the longest mark length among the mark lengths outputted from the mark length selection unit 120. Therefore, a maximum mark length can be detected while eliminating improper mark lengths which are caused by flaws or contamination on the optical disk.
机译:标记长度选择装置具有标记长度测量单元,该标记长度测量单元用于测量从光盘读取的信号的标记长度。标记长度选择单元,用于将连续的两个标记长度之一除以另一标记长度,该另一标记长度由标记长度测量单元测量,并在由标记长度测量单元测量的标记长度中选择一些标记长度。根据除法结果与预定阈值之间的比较结果,并输出选择的标记长度;最大标记长度检测单元,用于检测从标记长度选择单元 120输出的标记长度中的最长标记长度的最大标记长度。 因此,可以检测最大标记长度,同时消除由光盘上的缺陷或污染引起的不适当的标记长度。

著录项

  • 公开/公告号US6691072B2

    专利类型

  • 公开/公告日2004-02-10

    原文格式PDF

  • 申请/专利权人 MATSUSHITA ELECTRIC INDUSTRIAL CO. LTD.;

    申请/专利号US20020058224

  • 发明设计人 YUSHI TAMURA;AKIHIRO FUKE;

    申请日2002-01-29

  • 分类号G06F150/00;G11B270/00;

  • 国家 US

  • 入库时间 2022-08-21 23:12:35

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