TEST EQUIPMENT FOR TESTING PROGAMMABILITY OF ERASABLE PROGRAMMABLE SEMICONDUCTOR MEMORY DEVICE

摘要

Test equipment (100) for testing the programmability of a semiconductor programmable Read Only Memory device, the device having a plurality of memory cells (10) and data out lines (110), each memory cell having a drain (20) connected to the data out lines, the test equipment comprising: (a) a memory cell selector (102) for selecting a memory cell to be tested; (b) a voltage generator (104) connected to the drain of said memory cell, said voltage generator providing a substantially monotonically variable voltage to said memory cell so as to switch between a logic state " 1" of said memory cell and a logic state " 0" of said memory cell as read out on the data out lines; and (c) a detector (106) connected to the data out lines of the device for detecting the switch over voltage at which said switching between logic states occurs. 302 ו' בניסן התשס" ד - March 28, 2004