SCAN TEST METHOD PROVIDING REAL TIME IDENTIFICATION OF FAILING TEST PATTERNS AND TEST CONTROLLER FOR USE THEREWITH

摘要

A method of scan testing an integrated circuit to provide real time identification of a block of test patterns having at least one failing test pattern comprises performing (120) a number of test operations and storing (122) a test response signature corresponding to each block of test patterns into a signature register; replacing (124) the test response signature in the signature register with a test block expected signature; identifying (126) the block as a failing test block (128) when the test response signature is different from the test block expected signature; and repeating preceding steps until the test is complete.