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Scan test method providing real time identification of failing test patterns and test controller for use therewith
Scan test method providing real time identification of failing test patterns and test controller for use therewith
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机译:提供对失败的测试模式的实时识别的扫描测试方法以及与其一起使用的测试控制器
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摘要
A method of scan testing an integrated circuit to provide real time identification of a block of test patterns having at least one failing test pattern comprises performing a number of test operations and storing a test response signature corresponding to each block of test patterns into a signature register; replacing the test response signature in the signature register with a test block expected signature; identifying the block as a failing test block when the test response signature is different from the test block expected signature; and repeating preceding steps until the test is complete.
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