首页> 外国专利> EQUIPMENT AND METHOD FOR MONITORING WAFER MOVING STATE OF WAFER TRANSFER ROBOT

EQUIPMENT AND METHOD FOR MONITORING WAFER MOVING STATE OF WAFER TRANSFER ROBOT

机译:晶片传送机器人晶片运动状态监测的设备和方法

摘要

PURPOSE: A wafer transfer state checking apparatus of a wafer transfer robot and a method thereof are provided to be capable of detecting the contact between a robot arm and an unexpected wafer and generating an interlock signal when transferring an aiming wafer. CONSTITUTION: A wafer transfer state checking apparatus is provided with a transfer robot(10) having a robot arm(12) for transferring a wafer between a carrier(16) and a process module and a contact sensor(18) installed at the lower portion of the robot arm for detecting the contact state of an unexpected wafer. The wafer transfer state checking apparatus further includes a controller(20) for receiving a contact state detecting signal from the contact sensor and outputting an interlock generating signal and an alarm generation controlling signal.
机译:目的:提供一种晶片传送机械手的晶片传送状态检查装置及其方法,以能够在传送瞄准晶片时检测机械臂与意外晶片之间的接触并产生互锁信号。构成:一种晶片传送状态检查装置,其具有传送机器人(10),该传送机器人具有用于在载体(16)和处理模块之间传送晶片的机器人臂(12)以及安装在下部的接触传感器(18)。用于检测意外晶片的接触状态的自动机械臂的示意图。晶片传送状态检查装置还包括控制器(20),用于从接触传感器接收接触状态检测信号并输出​​联锁产生信号和警报产生控制信号。

著录项

  • 公开/公告号KR20040003309A

    专利类型

  • 公开/公告日2004-01-13

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20020037974

  • 发明设计人 LEE JONG HWA;

    申请日2002-07-02

  • 分类号H01L21/68;

  • 国家 KR

  • 入库时间 2022-08-21 22:50:00

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