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Method for fabricating CMOSFET having dual-gate

机译:具有双栅的CMOSFET的制造方法

摘要

PURPOSE: A method for manufacturing a CMOS transistor having a dual gate structure is provided to be capable of improving doping efficiency of gate electrodes without using an additional ion-implantation. CONSTITUTION: A gate oxide layer is formed on a semiconductor substrate(21) defined by a pMOS and nMOS region. An undoped polysilicon layer is formed on the gate oxide layer of the pMOS region, and an undoped polysilicon layer and a doped polysilicon layer are sequentially stacked on the gate oxide layer of the nMOS region. An integral doped polysilicon layer is formed at the nMOS region by diffusing dopants of the doped polysilicon layer into the undoped polysilicon layer. After the resultant structure is planarized, an NMOS gate electrode(28b) and a pMOS gate electrode(29a) are formed on the nMOS and pMOS region, respectively.
机译:目的:提供一种具有双栅结构的CMOS晶体管的制造方法,该方法能够在不使用额外的离子注入的情况下提高栅电极的掺杂效率。组成:在由pMOS和nMOS区域限定的半导体衬底(21)上形成栅氧化层。在pMOS区域的栅极氧化物层上形成未掺杂的多晶硅层,并且在nMOS区域的栅极氧化物层上顺序地堆叠未掺杂的多晶硅层和掺杂的多晶硅层。通过将掺杂的多晶硅层的掺杂剂扩散到未掺杂的多晶硅层中,在nMOS区域形成整体掺杂的多晶硅层。在平坦化所得结构之后,分别在nMOS和pMOS区域上形成NMOS栅电极(28b)和pMOS栅电极(29a)。

著录项

  • 公开/公告号KR20040004898A

    专利类型

  • 公开/公告日2004-01-16

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR20020039118

  • 发明设计人 LEE HUI SEUNG;

    申请日2002-07-06

  • 分类号H01L27/092;

  • 国家 KR

  • 入库时间 2022-08-21 22:50:03

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