首页>
外国专利>
METHOD FOR FABRICATING PZT THIN FILM TO REDUCE DEFECT AND FORM THIN FILM STRUCTURE MADE OF ONLY PURE PEROVSKITE
METHOD FOR FABRICATING PZT THIN FILM TO REDUCE DEFECT AND FORM THIN FILM STRUCTURE MADE OF ONLY PURE PEROVSKITE
展开▼
机译:制造PZT薄膜以减少仅纯钙钛矿制成的缺陷并形成薄膜结构的方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
PURPOSE: A method for fabricating a PZT(PbZrxTix-1O3) thin film is provided to reduce a defect and form a thin film structure made of only pure perovskite by forming a PZT thin film by a MOCVD(metal organic chemical vapor deposition) method. CONSTITUTION: An electrode(52) is formed on a substrate(51). A PZT initial thin film(54) is formed on the electrode. A PZT later thin film(56) is formed on the initial thin film. The PZT initial and later thin films are formed by a MOCVD method. A mixture gas of Pb, Zr and Ti that has a value (Pb/(Zr+Ti)1) in which the density of Pb is relatively greater than the sum of the density of Zr and Ti is used as a raw material gas(57) supplied for forming the PZT initial thin film.
展开▼