DIGITAL BLOCK TEST CIRCUIT AND DIGITAL TO ANALOG CONVERTER BY USING THE SAME, ESPECIALLY TESTING WITH SIMPLE CIRCUIT CONSTRUCTION WITHOUT ADDING PLURALITY OF PINS

摘要

PURPOSE: A digital block test circuit and a digital to analog converter(DAC) by using the same are provided to easily test with a simple circuit construction without adding a plurality of pins. CONSTITUTION: A digital block test circuit(210) includes an operation unit, a data storage unit an output controller and a random access memory(RAM) DAC. The operation unit inputs the output of the digital block as an input and performs a predetermined operation by inputting the previous operation result as another input. The data storage unit stores the output of the operation unit in response to the clock signal and outputs the stored value as another input of the operation unit. The output controller outputs the final operation result of the operation unit stored at the data storage unit to the input terminal of the digital block in response to the output enable signal. And, the RAM DAC performs the test for the output of the digital block from the signal applied to the input terminal of the digital block.